Microdose induced drain leakage effects in power trench MOSFETs: Experiment and modeling.
| Autor: | Zebrev, Gennady I., Vatuev, Alexander S., Useinov, Rustem G., Emeliyanov, Vladimir V., Anashin, Vasily S., Gorbunov, Maxim S., Turin, Valentin O. |
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| Zdroj: | 2013 14th European Conference on Radiation & Its Effects on Components & Systems (RADECS); 2013, p1-6, 6p |
| Databáze: | Complementary Index |
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