Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors.
| Autor: | Chakraborty, Partha S., Cressler, John D. |
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| Zdroj: | Hot Carrier Degradation in Semiconductor Devices; 2015, p371-398, 28p |
| Databáze: | Complementary Index |
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