| Autor: |
Eckardt, James R., Davis, Timothy L., Stern, Richard A., Wong, Cindy S., Marymee, Richard K., Bedjanian, Arde L. |
| Předmět: |
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| Zdroj: |
Defense AT&L; Nov/Dec2014, Vol. 43 Issue 6, p23-27, 5p, 2 Color Photographs, 2 Diagrams, 2 Charts, 2 Graphs |
| Abstrakt: |
The article focuses on the cost of detecting defects in software which include debugging, programming, and fixing. Topics discussed include several factors affecting cost growth during the defect-removal, the use of software Development Life Cycles (SDLC) to reduce cost, and several cost-effective defect-detection methods including developer verification and validation (V&V), independent testing, and independent verification and validation (IV&V). |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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