| Autor: |
Pananakakis, G., Ghibaudo, G., Papadas, C., Vincent, E., Kies, R. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 9/1/1997, Vol. 82 Issue 5, p2548, 10p, 2 Diagrams, 4 Charts, 16 Graphs |
| Abstrakt: |
Demonstrates the practicality of modeling the power law degradation observed in thin dielectrics after Fowler-Nordheim stress on the basis of a generalized trapping approach with trap cross-section and density profiles. Use of incomplete Gamma and generalized hypergeometric functions; Spatial distributions; Variation of the trapped oxide charge. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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