| Autor: |
Li, C.R., Tanner, B.K., Ashenford, D. E., Hogg, J. H. C., Lunn, B. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 9/1/1997, Vol. 82 Issue 5, p2281, 7p, 1 Chart, 14 Graphs |
| Abstrakt: |
Investigates the surface and interface structures of ZnTe epilayers grown by molecular beam epitaxy on GaSb substrates under different conditions by high resolution x-ray diffraction and grazing incidence scattering. Reciprocal space mapping; Ga2Te3 formation at the interface; Crystal truncation rod measurements. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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