Failure analysis of off-state leakage in high-voltage word-line decoder circuit of memory device.
| Autor: | Lai, K. W., Teng, A. S., Tu, C. H., Chang, T. Y., Hsueh, Julia, Lee, M.-Y., Kuo, Albert, Chao, Y. H., Hu, Scott, Tzeng, U. J., Lu, C.-Y. |
|---|---|
| Zdroj: | Proceedings of the 21th International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2014, p1-4, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|