Failure analysis of off-state leakage in high-voltage word-line decoder circuit of memory device.
Autor: | Lai, K. W., Teng, A. S., Tu, C. H., Chang, T. Y., Hsueh, Julia, Lee, M.-Y., Kuo, Albert, Chao, Y. H., Hu, Scott, Tzeng, U. J., Lu, C.-Y. |
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Zdroj: | Proceedings of the 21th International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2014, p1-4, 4p |
Databáze: | Complementary Index |
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