Model-Based Mutation Testing of an Industrial Measurement Device.
Autor: | Aichernig, Bernhard K., Auer, Jakob, Jöbstl, Elisabeth, Korošec, Robert, Krenn, Willibald, Schlick, Rupert, Schmidt, Birgit Vera |
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Zdroj: | Tests & Proofs: 8th International Conference, TAP 2014, Held as Part of STAF 2014, York, UK, July 24-25, 2014. Proceedings; 2014, p1-19, 19p |
Databáze: | Complementary Index |
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