Element Specific Monolayer Depth Profiling.

Autor: Macke, Sebastian, Radi, Abdullah, Hamann-Borrero, Jorge E., Verna, Adriano, Bluschke, Martin, Brück, Sebastian, Goering, Eberhard, Sutarto, Ronny, He, Feizhou, Cristiani, Georg, Wu, Meng, Benckiser, Eva, Habermeier, Hanns-Ulrich, Logvenov, Gennady, Gauquelin, Nicolas, Botton, Gianluigi A., Kajdos, Adam P., Stemmer, Susanne, Sawatzky, George A., Haverkort, Maurits W.
Zdroj: Advanced Materials; Oct2014, Vol. 26 Issue 38, p6554-6559, 6p
Databáze: Complementary Index
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