Identification of emission peaks in the spectra of oxide films on a metal surface in the infrared wavelength range.

Autor: Volkov, N., Kalin, B., Oleynikov, I., Valikov, R., Nekrasova, L.
Zdroj: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Sep2014, Vol. 8 Issue 5, p932-936, 5p
Abstrakt: An algorithm for the processing of infrared (IR) reflectance spectra is developed in order to simplify the analysis of the states of oxide films on a metal surface, which allows the types of molecular compounds in an oxide formed in an aqueous medium on the surface of samples pretreated with ion beams via different modes (cleaning, polishing) to be determined. Irregular local cracks and pores with sizes of more than 10-50 μm are found in the oxide films using the IR spectroscopy method. Chemical compounds with hydroxyl groups of the type Me-O and Me-OH are revealed. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index
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