Characteristics of dielectric film charging, depending on their thickness upon electron irradiation.

Autor: Gostev, A., Evstaf'eva, E., Rau, E., Tagachenkov, A., Tatarintsev, A.
Zdroj: Bulletin of the Russian Academy of Sciences: Physics; Sep2014, Vol. 78 Issue 9, p833-838, 6p
Abstrakt: Basic principles of charging dielectric films on conducting substrates upon irradiation with electrons of average energy are considered. A ratio associating the equilibrium charging potential and the mean thickness of the dielectric film is calculated. The analytical expression is in good agreement with experimental results over a wide range of energies for electrons irradiating the target. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index