A voltage base electrothermal model for the interconnection and E-Fuse under the DC and pulse stresses.
Autor: | Lee, Jian-Hsing, Prabhu, Manjunatha, Iyer, Natarajan Mahadeva, Wu, Cheng-Hsu, Chen-Hsin Lien |
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Zdroj: | 2014 IEEE International Reliability Physics Symposium; 2014, pEL.4.1-EL.4.6, 0p |
Databáze: | Complementary Index |
Externí odkaz: |