A voltage base electrothermal model for the interconnection and E-Fuse under the DC and pulse stresses.

Autor: Lee, Jian-Hsing, Prabhu, Manjunatha, Iyer, Natarajan Mahadeva, Wu, Cheng-Hsu, Chen-Hsin Lien
Zdroj: 2014 IEEE International Reliability Physics Symposium; 2014, pEL.4.1-EL.4.6, 0p
Databáze: Complementary Index