Scaling and reliability of NAND flash devices.
| Autor: | Youngwoo Park, Jaeduk Lee, Seong Soon Cho, Gyoyoung Jin, Eunseung Jung |
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| Zdroj: | 2014 IEEE International Reliability Physics Symposium; 2014, p2E.1.1-2E.1.4, 0p |
| Databáze: | Complementary Index |
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