Efficient test length reduction techniques for interposer-based 2.5D ICs.
| Autor: | Lu, Shyue-Kung, Li, Huai-Min, Hashizume, Masaki, Hong, Jin-Hua, Tsai, Zheng-Ru |
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| Zdroj: | Technical Papers of 2014 International Symposium on VLSI Design, Automation & Test; 2014, p1-4, 4p |
| Databáze: | Complementary Index |
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