Comparison of critical current filaments in IGBT short circuit and during diode turn-off.

Autor: Baburske, Roman, van Treek, Vera, Pfirsch, Frank, Niedernostheide, Franz-Josef, Jaeger, Christian, Schulze, Hans-Joachim, Felsl, Hans Peter
Zdroj: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD); 2014, p47-50, 4p
Databáze: Complementary Index