Accurate multiplexed test structure for threshold voltage matching evaluation.
| Autor: | Welter, Loic, Dreux, Philippe, Innocenti, Jordan, Aziza, Hassen, Portal, Jean-Michel |
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| Zdroj: | 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS); 2014, p1-6, 6p |
| Databáze: | Complementary Index |
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