Advanced diagnosis: SBST and BIST integration in automotive E/E architectures.
| Autor: | Reimann, Felix, Glass, Michael, Teich, Jurgen, Cook, Alejandro, Gomez, Laura Rodriguez, Ull, Dominik, Wunderlich, Hans-Joachim, Abelein, Ulrich, Engelke, Piet |
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| Zdroj: | 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC); 2014, p1-6, 6p |
| Databáze: | Complementary Index |
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