GPU-based timing-aware test generation for small delay defects.

Autor: Liao, Kuan-Yu, Chen, Po-Juei, Lin, Ang-Feng, Li, James Chien-Mo, Hsiao, Michael S., Wang, Laung-Terng
Zdroj: 2014 19th IEEE European Test Symposium (ETS); 2014, p1-2, 2p
Databáze: Complementary Index