Optimization-based multiple target test generation for highly compacted test sets.

Autor: Eggersglub, Stephan, Schmitz, Kenneth, Krenz-Baath, Rene, Drechsler, Rolf
Zdroj: 2014 19th IEEE European Test Symposium (ETS); 2014, p1-6, 6p
Databáze: Complementary Index