Software-based self-test generation for microprocessors with high-level decision diagrams.
Autor: | Ubar, Raimund, Tsertov, Anton, Jasnetski, Artjom, Brik, Marina |
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Zdroj: | 2014 15th Latin American Test Workshop - LATW; 2014, p1-6, 6p |
Databáze: | Complementary Index |
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