Thickness effect on the microstructure, morphology and optoelectronic properties of ZnS films.
| Autor: | Prathap, P., Revathi, N., Venkata Subbaiah, Y. P., Ramakrishna Reddy, K. T. |
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| Zdroj: | Journal of Physics: Condensed Matter; 1/23/2008, Vol. 20 Issue 3, p1-1, 1p |
| Databáze: | Complementary Index |
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