Electron paramagnetic resonance characterization of defects produced by ion implantation into silicon.
| Autor: | Barklie, R. C., O’Raifeartaigh, C. |
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| Zdroj: | Journal of Physics: Condensed Matter; 6/8/2005, Vol. 17 Issue 22, p1-1, 1p |
| Databáze: | Complementary Index |
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