Atomic Layer Deposition of SiN for spacer applications in high-end logic devices.
Autor: | Koehler, F., Triyoso, D. H., Hussain, I., Mutas, S., Bernhardt, H. |
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Zdroj: | IOP Conference Series: Materials Science & Engineering; 2012, Vol. 41 Issue 1, p1-1, 1p |
Databáze: | Complementary Index |
Externí odkaz: |