Atomic Layer Deposition of SiN for spacer applications in high-end logic devices.

Autor: Koehler, F., Triyoso, D. H., Hussain, I., Mutas, S., Bernhardt, H.
Zdroj: IOP Conference Series: Materials Science & Engineering; 2012, Vol. 41 Issue 1, p1-1, 1p
Databáze: Complementary Index