A model for radiation damage effects in carbon-doped crystalline silicon.
Autor: | Davies, G., Lightowlers, E. C., Newman, R. C., Oates, A. S. |
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Zdroj: | Semiconductor Science & Technology; Aug1987, Vol. 2 Issue 8, p1-1, 1p |
Databáze: | Complementary Index |
Externí odkaz: |