Spatially resolved high resolution interferometry.

Autor: Kroesen, G. M. W., Bisschops, T. H. J., Sanders, R. H. M., Jansen, A. W., Schram, D. C., Hoog, F. J. de
Zdroj: Measurement Science & Technology; Apr1991, Vol. 2 Issue 4, p1-1, 1p
Databáze: Complementary Index