Spatially resolved high resolution interferometry.
Autor: | Kroesen, G. M. W., Bisschops, T. H. J., Sanders, R. H. M., Jansen, A. W., Schram, D. C., Hoog, F. J. de |
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Zdroj: | Measurement Science & Technology; Apr1991, Vol. 2 Issue 4, p1-1, 1p |
Databáze: | Complementary Index |
Externí odkaz: |