| Autor: |
Gorzen, D. F., Armentrout, C., Burek, A., Bird, R., Geddes, J., Gerber, G., Rockett, P. D. |
| Předmět: |
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| Zdroj: |
Review of Scientific Instruments; Oct90, Vol. 61 Issue 10, p2768, 3p |
| Abstrakt: |
High-energy background radiation from PBFA II at Sandia National Laboratory introduces uncertainty regarding the effect of background fogging on the sensitivity of the x-ray film at soft x-ray energies. We have performed a calibration to determine how the sensitivity of the Kodak RAR 2492 film is affected by high-energy background radiation. To simulate the background radiation the film was fogged to various densities using a 10 keV bremsstrahlung spectrum. The film was then exposed to soft x-ray emission lines of Al Kα and Ti Kα selected by Bragg reflection from an electron bombardment source. The intensity of the x-ray flux was continuously monitored with a Si(Li) detector to eliminate error due to drift of the x-ray source's intensity. A microdensitometer with matched objectives was used to find the specular density of the exposed film. The results of the calibration are presented in the form of D vs log l for the various densities of the bremmstrahlung prefog exposures. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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