Soft x-ray microscopy with coherent x rays (invited).

Autor: Kirz, J., Ade, H., Jacobsen, C., Ko, C.-H., Lindaas, S., McNulty, I., Sayre, D., Williams, S., Zhang, X., Howells, M.
Předmět:
Zdroj: Review of Scientific Instruments; Jan1992, Vol. 63 Issue 1, p557, 7p
Abstrakt: The Soft X-ray Undulator beamline at the NSLS supports a soft x-ray imaging program including scanning transmission microscopy, scanning photoemission microscopy, Gabor and Fourier transform holography, and large angle diffraction. Zone plates from an LBL Center for X-ray Optics/IBM collaboration are used as optical elements. The current instrumentation of the beamline and the experimental stations is discussed, along with plans for the future at the NSLS and prospects for imaging programs at third generation sources. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index