| Autor: |
Eijkel, Kees J., de Haan, Poul, de Ridder, René M. |
| Předmět: |
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| Zdroj: |
Review of Scientific Instruments; Dec1988, Vol. 59 Issue 12, p2604, 5p |
| Abstrakt: |
It is well known that the orientation of the easy axis in permalloy can be affected by annealing. The need in our research for detailed information of the behavior of the easy-axis orientation in the temperature range from room temperature to 100 °C and the absence of measurement techniques to derive this information, led to the development of two new measurement techniques: (1) an adapted version of the Crowther method for measuring dispersion in easy-axis orientation combined with the optical Kerr technique and (2) a new measurement technique for determining the orientation of the easy axis combined with a galvanomagnetic method for determining magnetization direction. Both methods give detailed information on the behavior of the easy-axis orientation as a function of temperature. The resolution of both methods is 0.01° and may be increased, especially for the optical method. The optical method imposes few restrictions on film geometry and may be used, e.g., during a fabrication process. The easy-axis behavior can be observed locally. The galvanomagnetic technique requires four electrical contacts on the film. The easy-axis behavior is averaged over the total current-carrying area. This method can be used for observing the behavior of the easy axis in encapsulated devices. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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