New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System.
| Autor: | Jiruše, Jaroslav, Havelka, Miloslav, Haničinec, Martin, Polster, Jan, Hrnčíř, Tomáš |
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| Zdroj: | Microscopy & Microanalysis; Aug2014 Supplement, Vol. 20 Issue S3, p1104-1105, 2p |
| Databáze: | Complementary Index |
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