| Autor: |
Bergstrom, D.B., Petrov, I. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 7/1/1997, Vol. 82 Issue 1, p201, 9p, 6 Black and White Photographs, 1 Diagram, 8 Graphs |
| Abstrakt: |
Reports that polycrystalline bcc W layers were grown on amorphous-SiO2/Si(001) substrates by ultrahigh vacuum magnetron sputter deposition. As-deposited Al/W bilayers; Annealed Al/W bilayers; Interfacial reaction pathway during the annealing of polycrystalline Al/W bilayers; Role of W surface orientation and grain boundaries on Al/W bilayer interaction kinetics. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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