| Autor: |
Ghannam, Moustafa Y., Mahmoud, Samir F. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 3/15/1997, Vol. 81 Issue 6, p2665, 9p, 3 Diagrams, 4 Graphs |
| Abstrakt: |
Reports that optimization of the measurement sensitivity with the use of closed form analytical expression derived from an electrical equivalent circuit is performed for microwave detected photoconductance decay system used for nondestructive carrier lifetime measurement in silicon wafers. Conditions for maximum measurement sensitivity. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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