Dopant-selective etch stops in 6H and 3C SiC.

Autor: Shor, J.S., Kurtz, A.D.
Předmět:
Zdroj: Journal of Applied Physics; 2/1/1997, Vol. 81 Issue 3, p1546, 6p, 6 Black and White Photographs, 1 Diagram, 6 Graphs
Abstrakt: Describes a novel photoelectrochemical etching process for 6H- and 3C-SiC semiconductors. Basis for the etch-stop mechanism; Dissolution of silicon carbide.
Databáze: Complementary Index