Magnetic and physical microstructure of Fe16N2 films grown epitaxially on Si(001).

Autor: Brewer, M.A., Echer, C.J.
Předmět:
Zdroj: Journal of Applied Physics; 4/16/1997, Vol. 81 Issue 8, p4128, 3p, 3 Black and White Photographs, 1 Diagram, 1 Chart, 6 Graphs
Abstrakt: Investigates the magnetic and physical microstructure of Fe16N2 films grown epitaxially on Si(001) substrates with an Ag underlayer of reactive sputtering in nitrogen. Electron diffraction patterns; Mossbauer spectroscopy.
Databáze: Complementary Index