A semi-kinematic approach to x-ray diffraction of real crystals with small defects.

Autor: Li, M., Ress, H.
Předmět:
Zdroj: Journal of Applied Physics; 3/1/1997, Vol. 81 Issue 5, p2143, 5p, 2 Diagrams, 1 Graph
Abstrakt: Examines a semi-kinematic approach to x-ray diffraction of real crystals with small defects. Effect of multiple reflections; Darwin's recursion relations; Intensity of coherent scattering; Correlation function of the distortion field.
Databáze: Complementary Index