A semi-kinematic approach to x-ray diffraction of real crystals with small defects.
Autor: | Li, M., Ress, H. |
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Zdroj: | Journal of Applied Physics; 3/1/1997, Vol. 81 Issue 5, p2143, 5p, 2 Diagrams, 1 Graph |
Abstrakt: | Examines a semi-kinematic approach to x-ray diffraction of real crystals with small defects. Effect of multiple reflections; Darwin's recursion relations; Intensity of coherent scattering; Correlation function of the distortion field. |
Databáze: | Complementary Index |
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