NBTI in p-channel power U-MOSFETs: Understanding the degradation and the recovery mechanisms.
| Autor: | Tallarico, Andrea Natale, Magnone, Paolo, Barletta, Giacomo, Magri, Angelo, Sangiorgi, Enrico, Fiegna, Claudio |
|---|---|
| Zdroj: | 2014 15th International Conference on Ultimate Integration on Silicon (ULIS); 2014, p145-148, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|