Characterization of n-channel MOSFETs: Electrical measurements and simulation analysis.
| Autor: | Uhnevionak, V., Strenger, C., Burenkov, A., Mortet, V., Bedel-Pereira, E., Lorenz, J, Pichler, P. |
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| Zdroj: | 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC); 2013, p242-245, 4p |
| Databáze: | Complementary Index |
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