Electrical stressing of bilayer insulator HfO2/Al2O3 metal-insulator-insulator-metal (MIIM) diodes.
| Autor: | Klarr, T., Austin, D. Z., Alimardani, N., Conley, J. F. |
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| Zdroj: | 2013 IEEE International Integrated Reliability Workshop Final Report; 2013, p15-18, 4p |
| Databáze: | Complementary Index |
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