Testing PUF-based secure key storage circuits.
Autor: | Cortez, Mafalda, Roelofs, Gijs, Hamdioui, Said, di Natale, Giorgio |
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Zdroj: | 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE); 01/01/2014, p1-6, 6p |
Databáze: | Complementary Index |
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