A study of ultra-high performance SiGe HBT devices on SOI.

Autor: Thibeault, Todd, Preisler, Edward, Zheng, Jie, Dong, Li, Chaudhry, Samir, Jordan, Scott, Racanelli, Marco
Zdroj: 2013 IEEE Bipolar/BiCMOS Circuits & Technology Meeting (BCTM); 01/01/2013, p235-238, 4p
Databáze: Complementary Index