Study of mutual and self-thermal resistance in 90nm SiGe HBTs.
| Autor: | Jain, Vibhor, Zetterlund, Bjorn, Cheng, Peng, Camillo-Castillo, Renata A., Pekarik, John J., Adkisson, James W., Liu, Qizhi, Gray, Peter B., Kaushal, Vikas, Kessler, Thomas, Harame, David |
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| Zdroj: | 2013 IEEE Bipolar/BiCMOS Circuits & Technology Meeting (BCTM); 01/01/2013, p17-20, 4p |
| Databáze: | Complementary Index |
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