Performance of capacitively coupled active pixel sensors in 180 nm HV-CMOS technology after irradiation to HL-LHC fluences.
| Autor: | Feigl, S |
|---|---|
| Zdroj: | Journal of Instrumentation; Mar2014, Vol. 9 Issue 3, pC03020-C03020, 1p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|