Solder behavior and defect formation in joining process by Al/Ni self-propagating reaction.

Autor: Zhu, Wenbo, Wu, Fengshun, Xia, Weisheng, Wang, Baihui, Wang, Paul, Hou, Eric
Zdroj: 2013 14th International Conference on Electronic Packaging Technology; 2013, p1-5, 5p
Databáze: Complementary Index