| Autor: |
Siu, Karen K-W, Nikulin, Andrei Y., Wells, Peter, Harvey, Erol, Bigault, Thierry, Freund, Andreas K., Ishikawa, Tetsuya |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/1/2003, Vol. 93 Issue 9, p5161, 6p, 2 Diagrams, 3 Graphs |
| Abstrakt: |
An unambiguous inverse solution from Fraunhofer diffraction data has been achieved for an amorphous sample of low-molecular weight. The complex scattering amplitude has been reconstructed with submicron spatial resolution using the phase retrieval x-ray diffractometry technique. The technique relies on a logarithmic dispersion relation to determine the x-ray wave phase from the scattered intensity profile. Successful experimental localization of the zeros of the complex scattering amplitude was achieved by utilizing two data sets taken at different incident x-ray energies, permitting a unique solution. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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