| Autor: |
Serrano, A., Monton, C., Valmianski, I., Gálvez, F., Cortajarena, A. L., de la Venta, J., Schuller, Ivan K., Garcia, M. A. |
| Předmět: |
|
| Zdroj: |
Journal of Applied Physics; 2014, Vol. 115 Issue 10, p103106-1-103106-5, 5p, 1 Diagram, 1 Chart, 6 Graphs |
| Abstrakt: |
We present a Surface Plasmon Resonance spectroscopy study of Co-Phthalocyanine (CoPc) thin films grown on Au layers at different substrate temperatures. We demonstrate that for quantitative analysis, fitting of the resonance angle alone is insufficient and Whole Curve Analysis (WCA) needs to be performed. This is because CoPc thin film dielectric constant and thickness are strongly affected by substrate temperature, even when the total deposited mass remains fixed. Using WCA, we are able to uniquely fit both the dielectric constants and the thicknesses of the films without making a priori assumptions. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
