Noise analysis using on-chip waveform monitor in bandgap voltage references.

Autor: Murata, Akitaka, Agatsuma, Shuji, Ikoma, Daisaku, Ichikawa, Kouji, Tsuda, Takahiro, Nagata, Makoto, Yoshikawa, Kumpei, Araga, Yuuki, Harada, Yuji
Zdroj: 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo); 2013, p226-231, 6p
Databáze: Complementary Index