Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI.

Autor: Oliveira, C., Benfica, J., Bolzani Poehls, L. M., Vargas, F., Lipovetzky, J., Lutenberg, A., Gatti, E., Hernandez, F., Boyer, A.
Zdroj: 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo); 2013, p89-94, 6p
Databáze: Complementary Index