Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI.
Autor: | Oliveira, C., Benfica, J., Bolzani Poehls, L. M., Vargas, F., Lipovetzky, J., Lutenberg, A., Gatti, E., Hernandez, F., Boyer, A. |
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Zdroj: | 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo); 2013, p89-94, 6p |
Databáze: | Complementary Index |
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