High Reliability of High Power and High Brightness Diode Lasers.
| Autor: | Kanskar, M., Bao, L., Bai, J., Chen, Z., Dahlen, D., DeVito, M., Dong, W., Grimshaw, M., Haden, J., Guan, X., Hemenway, M., Kennedy, K., Martinsen, R., Tibbals, J., Urbanek, W., Zhang, S. |
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| Zdroj: | Proceedings of SPIE; Nov2014, p1-10, 10p |
| Databáze: | Complementary Index |
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