| Autor: |
Morales, Erie H., Wang, Y., Lederman, D., Kellock, A. J., Carey, M. J. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 4/15/2003, Vol. 93 Issue 8, p4729, 5p, 2 Charts, 8 Graphs |
| Abstrakt: |
Mn[sub x]Pt[sub 1-x](25 nm)/Co(8.0 nm) antiferromagnetic/ferromagnetic (AF/F) bilayers were grown via dc magnetron sputtering at room temperature on Si(111) substrates. Samples were annealed in a vacuum in a 1200 Oe magnetic field at various temperatures T[sub A] after growth. The Mn concentration x was determined from the MnPt lattice parameters and Rutherford backscattering spectroscopy. The maximum exchange bias (H[sub E]) was observed for x∼0.50, in agreement with previous work. Annealing caused the MnPt to form an ordered face-centered-tetragonal CuAu ordered structure which is necessary to observe H[sub E]. However, x-ray reflectivity indicates that an interdiffusion region exists at the MnPt/Co interface. The interdiffusion increases with T[sub A], resulting in lower H[sub E]. The T[sub A] that maximizes H[sub E], 318°C, is a compromise between the volume fraction of MnPt forming the ordered CuAu structure, which increases H[sub E], and the amount of interdiffusion, which decreases H[sub E]. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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