Orientation Mapping via Precession-Enhanced Electron Diffraction and Its Applications in Materials Science.

Autor:	Brons, J., Thompson, G.
Předmět:	CRYSTAL structure PRECESSION ELECTRON diffraction crystallography MATERIALS science TRANSMISSION electron microscopy KINEMATICS
Zdroj:	JOM: The Journal of The Minerals, Metals & Materials Society (TMS); Jan2014, Vol. 66 Issue 1, p165-170, 6p
Abstrakt:	Precession-enhanced diffraction (PED) is a transmission electron microscopy technique that allows for pseudo-kinematical diffraction conditions to occur. Using collected spot patterns, PED has successfully been demonstrated to provide for phase and orientation mapping in a variety of materials. One major advantage of PED is the fine spatial resolution, on the order of a few nanometers, allowing previously inaccessible grain boundary orientation mapping of nanostructured materials to be realized. This article provides a basic overview of the emerging technique with selected highlights of its application to materials science and engineering. [ABSTRACT FROM AUTHOR]
Databáze:	Complementary Index
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