Autor: |
Bach, Roger, Gronniger, Glen, Batelaan, Herman |
Předmět: |
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Zdroj: |
Applied Physics Letters; 12/16/2013, Vol. 103 Issue 25, p254102-254102-4, 1p, 1 Color Photograph, 3 Graphs |
Abstrakt: |
We present a demonstration of a three grating Talbot-Lau interferometer for electrons. As a proof of principle, the interferometer is used to measure magnetic fields. The device is similar to the classical Moiré deflectometer. The possibility to extend this work to build a scaled-up electron deflectometer or interferometer for sensitive magnetic field sensing is discussed. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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