CMOS scaling into the nanometer regime.

Autor: Yuan Taur, Buchanan, D.A., Wei Chen, Frank, D.J., Ismail, K.E., Shih-Hsien Lo, Sai-Halasz, G.A., Viswanathan, R.G., Wann, H.-J.C., Wind, S.J., Hon-Sum Wong
Zdroj: Proceedings of the IEEE; 1997, Vol. 85 Issue 4, p486-504, 19p
Databáze: Complementary Index