CMOS scaling into the nanometer regime.
| Autor: | Yuan Taur, Buchanan, D.A., Wei Chen, Frank, D.J., Ismail, K.E., Shih-Hsien Lo, Sai-Halasz, G.A., Viswanathan, R.G., Wann, H.-J.C., Wind, S.J., Hon-Sum Wong |
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| Zdroj: | Proceedings of the IEEE; 1997, Vol. 85 Issue 4, p486-504, 19p |
| Databáze: | Complementary Index |
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